98%
921
2 minutes
20
The rapid increase in data generation and storage poses substantial challenges, necessitating a transition from traditional charge-based devices to high-speed optical alternatives for computational tasks. Photon-assisted or plasmon-assisted memory devices emerge as promising solutions for facilitating faster read/write operations. By using surface plasmon polaritons for writing operations, we can dynamically read memory states through the measurement of tunneling currents in thin layers of HfO ferroelectric materials sandwiched between Au thin film electrodes. Our plasmon-addressable memory platform offers versatile functionality in both nanoelectronic and nanoplasmonic systems, demonstrating a robust hybrid architecture with transformative potential for computing and data processing applications.
Download full-text PDF |
Source |
---|---|
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC12063659 | PMC |
http://dx.doi.org/10.1126/sciadv.adr1172 | DOI Listing |
Sci Adv
May 2025
Department of Electrical and Computer Engineering, University of Alberta, Edmonton T6G 2V4, Canada.
The rapid increase in data generation and storage poses substantial challenges, necessitating a transition from traditional charge-based devices to high-speed optical alternatives for computational tasks. Photon-assisted or plasmon-assisted memory devices emerge as promising solutions for facilitating faster read/write operations. By using surface plasmon polaritons for writing operations, we can dynamically read memory states through the measurement of tunneling currents in thin layers of HfO ferroelectric materials sandwiched between Au thin film electrodes.
View Article and Find Full Text PDFUltramicroscopy
August 2019
Laboratoire de Physique des Solides, Université Paris-Sud, CNRS-UMR 8502, Orsay 91405, France. Electronic address:
We report on a novel way of performing stimulated electron energy-loss and energy-gain spectroscopy (sEELS/sEEGS) experiments that does not require a pulsed gun. In this scheme, a regular scanning transmission electron microscope (STEM) equipped with a conventional continuous electron gun is fitted with a modified EELS detector and a light injector in the object chamber. The modification of the EELS detector allows one to expose the EELS camera during tunable time intervals that can be synchronized with nanosecond laser pulses hitting the sample, therefore allowing us to collect only those electrons that have interacted with the sample under light irradiation.
View Article and Find Full Text PDF