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Article Abstract
Twisted halide perovskite bilayers, a type of moiré material, show square moiré patterns with exciting optical properties. Atomic-scale structure analysis and its correlation with properties are difficult to achieve due to the extreme sensitivity of organic-inorganic halide perovskites to the illuminated electron beam in conventional/scanning transmission electron microscopy. Here, we developed a low-dose exit wave reconstruction methodology with a real-space resolution of one angstrom at ∼50 e/Å, which recovers the phase information on the moiré fringes in CHNHPbI (MAPbI) twisted perovskite bilayers at atomic scale, enabling detailed structural analysis of defects and corresponding strain distribution in such moiré materials. This work provides an atomic-level understanding of electron beam-sensitive twisted bilayer materials.
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| http://dx.doi.org/10.1021/acsnano.4c11759 | DOI Listing |
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