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A high-precision current-mode bandgap reference (BGR) circuit with a high-order temperature compensation is presented in this paper. In order to achieve a high-precision BGR circuit, the equation of the nonlinear current has been modified and the high-order term of the current flowing into the nonlinear compensation bipolar junction transistor (NLCBJT) is compensated further. According to the modified equation, two solutions are designed to improve the output accuracy of BGR circuits. The first solution is to divide the NLCBJT branch into two branches to reduce the coefficient of the nonlinear temperature compensation current. The second solution is to inject the nonlinear current into the two branches based on the first one to further eliminate the temperature coefficient (TC) of the current flowing into the NLCBJT. The proposed BGR circuit has been designed using the Semiconductor Manufacturing International Corporation (SMIC) 55 nm CMOS process. The simulation results show that the variations in currents flowing into NLCBJTs improved from 148.41 nA to 69.35 nA and 7.4 nA, respectively, the TC of the output reference current of the proposed circuit is approximately 3.78 ppm/°C at a temperature range of -50 °C to 120 °C with a supply voltage of 3.3 V, the quiescent current consumption of the entire BGR circuit is 42.13 μA, and the size of the BGR layout is 0.044 mm, leading to the development of a high-precision BGR circuit.
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http://dx.doi.org/10.3390/mi14071420 | DOI Listing |
Sci Rep
August 2025
Deptartment of Electronics and Communication Engineering, VNR Vignana Jyothi Institute of Engineering and Technology, Hyderabad, India.
This work introduces the design and analysis of a Bandgap Reference (BGR) circuit with better temperature stability and reduced process variation. The second-order compensation method is implemented for design through an optimized error amplifier and a resistor network with a significantly better temperature coefficient performance. The startup mechanism is carefully designed for ensured strong and stable circuit performance under every variation of process-voltage-temperature (PVT).
View Article and Find Full Text PDFMicromachines (Basel)
October 2024
School of Physical Science and Technology, Lanzhou University, Lanzhou 730000, China.
With the continuous advancement of electronic technology, the application of high-voltage integrated circuits is becoming increasingly prevalent in fields such as power systems, medical devices, and industrial automation. The reference circuit within high-voltage integrated circuits must not only exhibit insensitivity to temperature variations but also maintain stability across a broad voltage supply. This paper presents a bandgap reference (BGR) source capable of operating over a wide input range.
View Article and Find Full Text PDFMicromachines (Basel)
September 2023
Department of Electrical and Electronics Engineering, Istanbul University, 34320 Istanbul, Turkey.
An Auto-Trimming CMOS Bandgap References Circuit (ATBGR) with PSRR enhancement circuit for Artificial Intelligence of Things (AIoT) chips is presented in this paper. The ATBGR is designed with a first-order temperature compensation technique providing a stable reference voltage of 1.25 V in the ranges of input voltages from 1.
View Article and Find Full Text PDFMicromachines (Basel)
July 2023
State Key Laboratory of Materials for Integrated Circuits, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, 865 Changning Road, Shanghai 200050, China.
A high-precision current-mode bandgap reference (BGR) circuit with a high-order temperature compensation is presented in this paper. In order to achieve a high-precision BGR circuit, the equation of the nonlinear current has been modified and the high-order term of the current flowing into the nonlinear compensation bipolar junction transistor (NLCBJT) is compensated further. According to the modified equation, two solutions are designed to improve the output accuracy of BGR circuits.
View Article and Find Full Text PDFMicrosyst Nanoeng
April 2023
Department of Precision Instruments, Tsinghua University, Beijing, 100084 China.
High-precision microelectromechanical system (MEMS) gyroscopes are significant in many applications. Bias instability (BI) is an important parameter that indicates the performance of a MEMS gyroscope and is affected by the 1/ noise of the MEMS resonator and readout circuit. Since the bandgap reference (BGR) is an important block in the readout circuit, reducing its 1/ noise is key to improving a gyroscope's BI.
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