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X-ray dual-phase grating interferometry provides quantitative micro-structural information beyond the optical resolution through its tunable correlation length. Ensuring optimal performance of the set-up requires accurate correlation length estimation and precise alignment of the gratings. This paper presents an automated procedure for determining the complete geometrical parameters of the interferometer set-up with a high degree of precision. The algorithm's effectiveness is then evaluated through a series of experimental tests, illustrating its accuracy and robustness.
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http://dx.doi.org/10.1364/OE.518821 | DOI Listing |
A tunable dual-frequency fiber laser is a crucial in a precision measurement system, significantly influencing measurement accuracy and cost. Consequently, a low beating frequency is preferred in many applications, such as coherence measurement. This paper demonstrates a novel, to our knowledge, dual-frequency, erbium-doped fiber laser, utilizing the Vernier effect and dual phase-shifted fiber Bragg gratings (PS-FBGs), with a beating frequency of 300 MHz.
View Article and Find Full Text PDFX-ray dual-phase grating interferometry provides quantitative micro-structural information beyond the optical resolution through its tunable correlation length. Ensuring optimal performance of the set-up requires accurate correlation length estimation and precise alignment of the gratings. This paper presents an automated procedure for determining the complete geometrical parameters of the interferometer set-up with a high degree of precision.
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December 2023
X-ray dark-filed imaging is a powerful approach to quantify the dimension of micro-structures of the object. Often, a series of dark-filed signals have to be measured under various correlation lengths. For instance, this is often achieved by adjusting the sample positions by multiple times in Talbot-Lau interferometer.
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January 2024
Radiation Physics Research group, Department Physics and Astronomy, Ghent University, 9000, Ghent, Belgium.
The multi-scale characterization of building materials is necessary to understand complex mechanical processes, with the goal of developing new more sustainable materials. To that end, imaging methods are often used in materials science to characterize the microscale. However, these methods compromise the volume of interest to achieve a higher resolution.
View Article and Find Full Text PDFThe dark-field signal provided by X-ray grating interferometry is an invaluable tool for providing structural information beyond the direct spatial resolution and their variations on a macroscopic scale. However, when using a polychromatic source, the beam-hardening effect in the dark-field signal makes the quantitative sub-resolution structural information inaccessible. Especially, the beam-hardening effect in dual-phase grating interferometry varies with spatial location, inter-grating distance, and diffraction order.
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