Non-zero-crossing current-voltage hysteresis behavior induced by capacitive effects in bio-memristor.

J Colloid Interface Sci

School of Physical Science and Technology, Key Laboratory of Advanced Technologies of Materials, Ministry of Education of China, Southwest Jiaotong University, Chengdu 610031, China; Superconductivity and New Energy R&D Center (SNERDC), Southwest Jiaotong University, Chengdu 610031, China; Waterloo

Published: February 2020


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Article Abstract

Capacitive devices have drawn a beautiful application scene in electronic device systems ranging from touch sensors, energy storages and multifunction transistors, but serving as memristive term is still blank. Sweet potato peel (SPP) as function layer was employed to develop the memristive device with Ag/SPP/F-doped SnO (FTO) structure. A current-voltage (I-V) hysteresis, which is characterized by a typical capacitive behavior, is impressively observed in the developed device. Nonvolatile data storage is feasible using the non-zero-crossing I-V hysteresis because the resistance states can be well maintained. Charge transfer at the Ag/SPP and SPP/FTO interfaces, and the interplay between Ag ions and charges are responsible for this non-zero-crossing I-V hysteresis behaviors. This work possibly gives an insight into the data storage in terms of a new conception electronic device based on environment-friendly material.

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http://dx.doi.org/10.1016/j.jcis.2019.10.087DOI Listing

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