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Article Abstract
The characterization of the processing-induced defects is an essential step for developing defect-free processing, which is important to the assurance of structural reliability of brittle ceramics. The multiscale X-ray computed tomography, consisting of micro-CT as a wide-field and low-resolution system and nano-CT as a narrow-field and high-resolution system, is suitable for observing crack-like defects with small length and with very small crack opening displacement. Here we applied this powerful imaging tool in order to reveal the complicated three-dimensional morphology of defects evolved during sintering of alumina. The hierarchical packing structure of granules was the origin of several types of strength-limiting defects, which could not be eliminated due to the differential sintering of heterogeneous microstructures. This imaging technique of internal defects provides a link between the processing and the fracture strength for the development of structural materials.
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| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC6690982 | PMC |
| http://dx.doi.org/10.1038/s41598-019-48127-y | DOI Listing |
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