Severity: Warning
Message: file_get_contents(https://...@gmail.com&api_key=61f08fa0b96a73de8c900d749fcb997acc09&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 197
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 197
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 271
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3165
Function: getPubMedXML
File: /var/www/html/application/controllers/Detail.php
Line: 597
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 511
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 317
Function: require_once
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Solution processed interfacial layers are commonly employed in bulk heterojunction organic solar cells (OSCs) for better charge collection. PDIN interfacial layers were prepared by employing a static or dynamic spin coating method from PDIN methanol solution, and defined as the S-PDIN or D-PDIN layer. The OSCs with a S-PDIN layer exhibit 13.88% power conversion efficiency (PCE) with a virtual high short circuit density (JSC) of 26.45 mA cm-2 and relatively low fill factor (FF) of 58.94% during the current density versus voltage (J-V) measurement without a shadow mask. 12.56% PCE is achieved for OSCs with a D-PDIN layer, along with a JSC of 18.85 mA cm-2 and FF of 74.88%. Over 77% FFs are obtained for OSCs with a S-PDIN or D-PDIN layer during J-V measurement with a shadow mask, and both OSCs exhibit a very similar JSC and PCE. The virtual high JSCs and relatively low FF of OSCs with a S-PDIN layer may be due to the enhanced conductivity of PEDOT:PSS during preparation of the PDIN layer by the SSC method, which can be further confirmed from the OSCs with a methanol treated PEDOT:PSS layer. This work indicates that a well-balanced JSC and FF should be an important evaluating indicator for efficient OSCs, and an appropriate shadow mask is necessary to measure the J-V curves of OSCs with a solution processed interfacial layer.
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http://dx.doi.org/10.1039/c9cp00181f | DOI Listing |