J Phys Chem Lett
October 2024
The atomic configurations and concentrations of intrinsic defects profoundly influence the electrical and optical properties of the semiconductor materials. This influence is particularly significant in the case of β-GaO, which is a highly promising ultrawide bandgap semiconductor characterized by highly complex intrinsic defect configurations. Despite its importance, there is a notable absence of an accurate method to recognize these defects in large-scale atomistic computational modeling.
View Article and Find Full Text PDFMicromachines (Basel)
August 2024
The preparation method of transmission electron microscopy (TEM) samples for pure zirconium was successfully executed using a focused ion beam (FIB) system. These samples unveiled artifact hydrides induced during the FIB sample preparation process, which resulted from stress damage, ion implantation, and ion irradiation. An innovative solution was proposed to effectively reduce the effect of artifact hydrides for FIB-prepared samples of hydrogen-sensitive materials, such as zirconium alloys.
View Article and Find Full Text PDFA key challenge for electrochemical nitrogen reduction reactions (NRR) is the difficulty for conventional catalysts to achieve high currents at low H* coverage to produce appreciable NH . Herein, we specially designed an Au nanoparticle-embedded ZnSe photo-electrode to solve the problem. As-designed photo-electrode achieves excellent NRR performance with a high NH yield (12.
View Article and Find Full Text PDFMicromachines (Basel)
December 2021
Atomic probe tomography (APT) samples with Al/Ni multilayer structure were successfully prepared by using a focused ion beam (FIB), combining with a field emission scanning electron microscope, with a new single-wedge lift-out method and a reduced amorphous damage layer of Ga ions implantation. The optimum vertex angle and preparation parameters of APT sample were discussed. The double interdiffusion relationship of the multilayer films was successfully observed by the local electrode APT, which laid a foundation for further study of the interface composition and crystal structure of the two-phase composites.
View Article and Find Full Text PDFMolecular dynamics simulation is adopted to discover the formation mechanism of silicon vacancy color center and to study the damage evolution in 4H-SiC during helium ion implantation with different annealing temperatures. The number and distribution of silicon vacancy color centers during He ion implantation can be more accurately simulated by introducing the ionization energy loss during implantation. A new method for numerical statistic of silicon vacancy color centers is proposed, which takes into account the structure around the color centers and makes statistical results more accurate than the Wigner-Seitz defect analysis method.
View Article and Find Full Text PDFPurpose: Accurate glioma grading and IDH mutation status prediction are critically essential for individualized preoperative treatment decisions. This study aims to compare the diagnostic performance of magnetic resonance (MR) amide proton transfer (APT) and diffusion kurtosis imaging (DKI) in glioma grading and IDH mutation status prediction.
Method: Fifty-one glioma patients without treatment were retrospectively included.
Integrable and nonintegrable discrete nonlinear Schrödinger equations (NLS) are significant models to describe many phenomena in physics. Recently, Ablowitz and Musslimani introduced a class of reverse space, reverse time, and reverse space-time nonlocal integrable equations, including the nonlocal NLS equation, nonlocal sine-Gordon equation, nonlocal Davey-Stewartson equation, etc. Moreover, the integrable nonlocal discrete NLS has been exactly solved by inverse scattering transform.
View Article and Find Full Text PDFMicromachines (Basel)
July 2018
The defects and subsurface damages induced by crystal growth and micro/nano-machining have a significant impact on the functional performance of machined products. Raman spectroscopy is an efficient, powerful, and non-destructive testing method to characterize these defects and subsurface damages. This paper aims to review the fundamentals and applications of Raman spectroscopy on the characterization of defects and subsurface damages in micro/nano-machining.
View Article and Find Full Text PDFBeilstein J Nanotechnol
December 2015
Many factors influence the near-field visualization of plasmonic structures that are based on perforated elliptical slits. Here, characterization errors are experimentally analyzed in detail from both fabrication and measurement points of view. Some issues such as geometrical parameter, probe-sample surface interaction, misalignment, stigmation, and internal stress, have influence on the final near-field probing results.
View Article and Find Full Text PDFPhys Rev E Stat Nonlin Soft Matter Phys
June 2015
A Kadomtsev-Petviashvili- (KP-) type equation appears in fluid mechanics, plasma physics, and gas dynamics. In this paper, we propose an integrable semidiscrete analog of a coupled (2+1)-dimensional system which is related to the KP equation and the Zakharov equation. N-soliton solutions of the discrete equation are presented.
View Article and Find Full Text PDFCdS nanoflake arrays (NFAs) exhibit unprecedented light absorption capability, and they can serve as a scaffold to load thin organic absorbers for extraordinarily high light absorption. As a result, the hybrid solar cell consisting of NFAs and organic absorber yields a ten-times high short-circuit photocurrent compared to the counterpart device with a common planar structure.
View Article and Find Full Text PDFA novel method with high flexibility and efficiency for developing SERS substrates is proposed by patterning nanostructures on Si substrates using focused ion beam direct writing (FIBDW) technology following with precise thermal evaporation of gold film on the substrate. The effect of SERS on the substrate was systematically investigated by optimizing the processing parameters and the gold film thickness. The results proved that small dwell time could improve the machining accuracy and obtain smaller nanogap.
View Article and Find Full Text PDFOpt Express
February 2010
A plasmonic lens with metallic chirped circular nanoslits corrugated on Au film supported on quartz substrate for the purpose of superfocusing was put forth and fabricated by means of focused ion beam direct milling technique. Topography of the lens was imaged using an atomic force microscope. After that a near-field scanning optical microscope was employed for optical characterization of focusing performance of the lens.
View Article and Find Full Text PDFBiochem Biophys Res Commun
August 2006
Double minute chromosomes (DMs) are acentric, autonomously replicating extra-chromosomes and frequently mediate gene amplification in tumor and drug resistant cells. Atomic force microscopy (AFM) is a powerful tool in microbiology. We used AFM to explore the ultrastructure of DMs in mouse fibroblasts 3T3R500.
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