Performance of Dual-Layer Flat-Panel Detectors.

Diagnostics (Basel)

Division of Semiconductor and Electronics Engineering, Hankuk University of Foreign Studies, Yongin-si 17035, Gyeonggi-do, Republic of Korea.

Published: July 2025


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Article Abstract

In digital radiography imaging, dual-layer flat-panel detectors (DFDs), in which two flat-panel detector layers are stacked with a minimal distance between the layers and appropriate alignment, are commonly used in material decompositions as dual-energy applications with a single x-ray exposure. DFDs also enable more efficient use of incident photons, resulting in x-ray images with improved noise power spectrum (NPS) and detection quantum efficiency (DQE) performances as single-energy applications. Purpose: Although the development of DFD systems for material decomposition applications is actively underway, there is a lack of research on whether single-energy applications of DFD can achieve better performance than the single-layer case. In this paper, we experimentally observe the DFD performance in terms of the modulation transfer function (MTF), NPS, and DQE with discussions. Using prototypes of DFD, we experimentally measure the MTF, NPS, and DQE of the convex combination of the images acquired from the upper and lower detector layers of DFD. To optimize DFD performance, a two-step image registration is performed, where subpixel registration based on the maximum amplitude response to the transform based on the Fourier shift theorem and an affine transformation using cubic interpolation are adopted. The DFD performance is analyzed and discussed through extensive experiments for various scintillator thicknesses, x-ray beam conditions, and incident doses. Under the RQA 9 beam conditions of 2.7 μGy dose, the DFD with the upper and lower scintillator thicknesses of 0.5 mm could achieve a zero-frequency DQE of 75%, compared to 56% when using a single-layer detector. This implies that the DFD using 75 % of the incident dose of a single-layer detector can provide the same signal-to-noise ratio as a single-layer detector. In single-energy radiography imaging, DFD can provide better NPS and DQE performances than the case of the single-layer detector, especially at relatively high x-ray energies, which enables low-dose imaging.

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http://www.ncbi.nlm.nih.gov/pmc/articles/PMC12345963PMC
http://dx.doi.org/10.3390/diagnostics15151889DOI Listing

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Performance of Dual-Layer Flat-Panel Detectors.

Diagnostics (Basel)

July 2025

Division of Semiconductor and Electronics Engineering, Hankuk University of Foreign Studies, Yongin-si 17035, Gyeonggi-do, Republic of Korea.

In digital radiography imaging, dual-layer flat-panel detectors (DFDs), in which two flat-panel detector layers are stacked with a minimal distance between the layers and appropriate alignment, are commonly used in material decompositions as dual-energy applications with a single x-ray exposure. DFDs also enable more efficient use of incident photons, resulting in x-ray images with improved noise power spectrum (NPS) and detection quantum efficiency (DQE) performances as single-energy applications. Purpose: Although the development of DFD systems for material decomposition applications is actively underway, there is a lack of research on whether single-energy applications of DFD can achieve better performance than the single-layer case.

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