Non-interferometric measurement method for spherical lens surface profile via multiplane accelerated Wirtinger flow.

Spherical lenses are ubiquitously employed optical elements, and their surface profile errors can introduce significant negative impact on transmitted wavefront quality. Within the metrology of precision optical components, interferometry remains the gold standard for surface characterization. However, the interferometry necessitates sophisticated optical configurations that demonstrate susceptibility to environmental factors, coupled with the requirement for high precision reference mirrors corresponding to specific F-numbers of spherical lenses. In this paper, a non-interferometric measurement method of spherical lens surface profile via multiplane accelerated Wirtinger flow (MP-AWF) is proposed. The method allows simultaneous measurement of the phase and amplitude of the sample with a compact optical arrangement, where the spherical lens surface profile can be obtained from phase information and the defect distribution from amplitude information. The measurement results are consistent with interferometry. This method holds significant potential for future deployment as a cost-efficient metrological solution with minimal environmental constraints for surface profile characterization of spherical optical components in routine operational scenarios.