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Interfacial electron transfer triggered reversible hydrogen spillover effect boosts high-efficient hydrogen evolution. | LitMetric

Interfacial electron transfer triggered reversible hydrogen spillover effect boosts high-efficient hydrogen evolution.

J Colloid Interface Sci

State Key Laboratory of Materials Low-Carbon Recycling, College of Material Science and Engineering, Beijing University of Technology, 100124, Beijing, PR China; College of Carbon Neutrality Future Technology, Beijing University of Technology, 100124, Beijing, PR China. Electronic address: lhy06@bju

Published: December 2025


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Article Abstract

The mechanistic role of interfacial electron transfer in enabling reversible hydrogen spillover for enhanced hydrogen evolution reaction (HER) kinetics remains fundamentally unexplored. Herein, we report a lattice-matched PtCoNiCuZn/ WCN heterostructure electrode, where interfacial electron transfer triggers reversible hydrogen spillover, thereby achieving exceptional HER performance. Advanced characterization reveals coherent and semicoherent interfaces that induce charge redistribution, creating electron-deficient Pt sites with optimally downshifted d-band centers. The electrode exhibits a remarkable mass activity of 4.63 A mgPt, which is 22 times higher than that of commercial Pt/C, and demonstrates exceptional stability for over 300 h at 10 mA cm, attributed to strong metal-support interactions (SMSI). Density functional theory (DFT) calculations confirm a reversible hydrogen spillover mechanism driven by a built-in electric field at the heterojunction. This electric field facilitates *H migration from WCN to the alloy, alleviating hydrogen accumulation on the support and enhancing metal-site desorption, thus accelerating HER kinetics. This study provides critical insights into the role of interfacial electron transfer in hydrogen spillover and establishes a rational design strategy for highly active and stable self-supported electrodes in sustainable hydrogen production.

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http://dx.doi.org/10.1016/j.jcis.2025.138452DOI Listing

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