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Polyelectrolyte multilayer (PEM) thin films, fabricated at nano-scale by Layer-by-Layer (LbL) self-assembly techniques, have diverse nanotechnology applications. Precise thickness measurement during layer buildup is crucial in controlling the thickness. In this work, we present a novel optical measurement technique for in-situ analysis of the PEM film build-up by utilizing Etched Fiber Bragg Gratings (EFBG)-based sensors to quantify the deposited thickness. PEM films were deposited over EFBG by alternative deposition of weak polyelectrolytes Poly(allylamine hydrochloride)(PAH) and Poly(acrylic acid)(PAA) with quantitative analysis of adsorption and desorption steps at varying pH conditions. Further, the desorption process was observed in detail at the sub-nanometer scale, with PAA exhibiting a linear desorption while PAH follows an exponential desorption. This validates the inter-diffusive behavior of the low molecular weight polyelectrolytes during the PEM buildup, not only during the adsorption process but also during the desorption process. Thus, EFBG could be utilized as a precision tool to extract fundamental information during individual PEM layer build-up, thereby fine-tuning the nano-scale architecture of multilayers.
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http://dx.doi.org/10.1038/s42004-025-01602-2 | DOI Listing |
Microscopy (Oxf)
August 2025
International Center for Quantum Materials, and Electron Microscopy Laboratory, School of Physics, Peking University, Beijing, China.
Scanning transmission electron microscopy-electron energy loss spectroscopy (STEM-EELS) has emerged as a state-of-the-art characterization modality in materials science, undergoing transformative advancements over the past decade. Revolutionary developments in monochromator technology have pushed EELS energy resolution into the sub-10 meV regime, enabling investigations of low-energy excitations such as phonons, excitons, plasmons, and polaritons at nanometer and sub-nanometer scales, in addition to traditional core-loss spectroscopy. Besides to the high spatial resolution and high energy resolution, the coherent nature of STEM electron probes now allows momentum-resolved spectral information to be acquired, providing an ideal platform for correlating nanoscale structural features with functional properties at the nanometer and atomic level.
View Article and Find Full Text PDFMicrosc Microanal
July 2025
Department of Materials Science and Engineering, Hearst Memorial Mining Building, University of California, Berkeley, CA 94720, USA.
Irradiation produces a distribution of defect sizes in materials, with the smallest defects often below one nanometer in size and approaching the scale of a single unit cell in metals. While high-resolution scanning transmission electron microscopy (STEM)-based imaging can directly image structures at this level, techniques such as four-dimensional STEM (4D-STEM) enable characterization of materials across large fields of view, capturing a more representative volume that can be valuable for quantifying defects, their distributions, and the associated strain fields. Here we present a combined HRSTEM and 4D-STEM approach to study the model system of He bubble implantation in an Au thin film.
View Article and Find Full Text PDFOpt Express
February 2025
To meet the stringent requirements for sub-nanometer surface roughness and full-spectrum spatial frequency error control in high-precision optical systems, this study systematically investigates the effects of varying Cerium oxide (CeO) abrasive particle sizes and pitch pad hardness on the surface quality of fused silica glass during computer-controlled optical surfacing (CCOS). This study integrates experimental characterization with mathematical modeling to analyze the mechanisms by which abrasive particle size and polishing tool hardness influence material removal rates, contact pressure distribution, and surface roughness. The results indicate that smaller CeO particles effectively reduce high-spatial frequency roughness, making them suitable for precise micro-surface finishing, while larger particles exhibit higher material removal efficiency, making them more suitable for macro-surface machining.
View Article and Find Full Text PDFSmall Methods
August 2025
Department of Chemical Engineering, University College London, London, WC1E 7JE, UK.
Polymers of intrinsic microporosity (PIMs) are a unique class of soft materials, which, unlike hard materials such as zeolites or carbons, are capable of both vapor adsorption (nanopore filling) and absorption (polymer plasticization/swelling). While adsorption is governed by pore structure and surface functionalization, adsorption depends on the chemical composition of the matrix material. Since both adsorption and absorption increase sorbent mass (vapor uptake), gravimetric and volumetric characterization methods exhibit severe limitations in isotherm interpretation.
View Article and Find Full Text PDFAngew Chem Int Ed Engl
September 2025
Division of Energy Storage, Dalian National Laboratory for Clean Energy, Dalian Institute of Chemical Physics, Chinese Academy of Sciences, 457 Zhongshan Road, Dalian, 116023, China.
Ion-selective membranes with sub-nanometer micropores are essential in various separation processes and energy-related devices. However, the absence of molecular-level insights into ion transport behavior in sub-nanochannels challenges the accurate construction of fit-for-purpose membranes. Herein, we design cross-linked polybenzimidazole membranes with varying angstrom-scale pores and functional group densities by in situ crosslinking reaction during dual-coagulation bath-induced phase separation process.
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