Severity: Warning
Message: file_get_contents(https://...@gmail.com&api_key=61f08fa0b96a73de8c900d749fcb997acc09&a=1): Failed to open stream: HTTP request failed! HTTP/1.1 429 Too Many Requests
Filename: helpers/my_audit_helper.php
Line Number: 197
Backtrace:
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 197
Function: file_get_contents
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 271
Function: simplexml_load_file_from_url
File: /var/www/html/application/helpers/my_audit_helper.php
Line: 3165
Function: getPubMedXML
File: /var/www/html/application/controllers/Detail.php
Line: 597
Function: pubMedSearch_Global
File: /var/www/html/application/controllers/Detail.php
Line: 511
Function: pubMedGetRelatedKeyword
File: /var/www/html/index.php
Line: 317
Function: require_once
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ZnO has been traditionally applied in organic solar cells (OSCs) as an electron transport layer (ETL). However, inevitable vacancy defects on the surface of ZnO result in trap-assisted recombination centers and thus low-efficiency electron transport in OSCs. Herein, an effective and facile method has been developed to modify the ZnO surface with 2D g-CN for high-performance and stable OSCs. The results show that 2D g-CN can effectively passivate various defects on the surface of ZnO, such as oxygen vacancies and OH, leading to the reduction of the work function of the ZnO layer. The combination of theoretical calculations and experimental characterizations reveals a charge transfer mechanism between g-CN and the ZnO surface and a physical mechanism of oxygen vacancy filling in ZnO. Furthermore, with 1 wt% g-CN-modified ZnO as the ETL, inverted OSCs based on PM6: 2,2'- [[12,13-Bis(2-butyloctyl)-12,13-dihydro-3,9-dinonylbisthieno[2″,3″:4',5']thieno[2',3':4,5]pyrrolo[3,2-e:2',3'-g][2,1,3]benzothiadiazole-2,10-diyl]bis[methylidyne(5,6-chloro-3-oxo-1H-indene-2,1(3H)-diylidene)]]bis[propanedinitrile] (BTP-eC9) and PM6:L8-BO:BTP-eC9 exhibit the highest the power conversion efficiency (PCE) of 18.01% and 18.84%, respectively, which is much higher than that for the corresponding reference devices without the modified ETL (16.32% and 17.67%). Therefore, this study provides an effective and facile way for the defect modification of ZnO by 2D materials, and offers a deep understanding of the passivation mechanism of ZnO defects.
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http://dx.doi.org/10.1002/cssc.202500889 | DOI Listing |