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In this work, we report an n-type metal-oxide-semiconductor (nMOS) inverter using chemical vapor deposition (CVD)-grown monolayer WS field-effect transistors (FETs). Our large-area CVD-grown monolayer WS FETs exhibit outstanding electrical properties including a high on/off ratio, small subthreshold swing, and excellent drain-induced barrier lowering. These are achieved by n-type doping using AlO/AlO and a double-gate structure employing high- dielectric HfO. Due to the superior subthreshold characteristics, monolayer WS FETs show high transconductance and high output resistance in the subthreshold regime, resulting in significantly higher intrinsic gain compared to conventional Si MOSFETs. Therefore, we successfully realize subthreshold operating monolayer WS nMOS inverters with extremely high gains of 564 and 2056 at supply voltage () of 1 and 2 V, respectively, and low power consumption of ∼2.3 pW·μm at = 1 V. In addition, the monolayer WS nMOS inverter is further expanded to the demonstration of logic circuits such as AND, OR, NAND, NOR logic gates, and SRAM. These findings suggest the potential of monolayer WS for high-gain and low-power logic circuits and validate the practical application in large areas.
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http://dx.doi.org/10.1021/acsnano.4c04316 | DOI Listing |
Nanomaterials (Basel)
August 2025
Department of Semiconductor Engineering, Gachon University, Seongnam City 13120, Republic of Korea.
Amorphous indium gallium zinc oxide (a-IGZO) is widely used as an oxide semiconductor in the electronics industry due to its low leakage current and high field-effect mobility. However, a-IGZO suffers from notable limitations, including crystallization at temperatures above 600 °C and the high cost of indium. To address these issues, nitrogen-doped zinc oxynitride (ZnON), which can be processed at room temperature, has been proposed.
View Article and Find Full Text PDFSmall
August 2025
Department of Electronic Materials Engineering, Kwangwoon University, Seoul, 01897, Republic of Korea.
The restorative effects of sulfur (S)-passivation through low-temperature (160 °C) post-S annealing on the performance and stability of monolayer molybdenum disulfide (MoS) field-effect transistors (FETs) are investigated. S-passivation suppresses S vacancies in the monolayer MoS channel, restoring its intrinsic electrical and material properties and leading to enhancements in field-effect mobility from 8 to 95 cm V s and subthreshold swing from 0.21 to 0.
View Article and Find Full Text PDFACS Nano
August 2025
2D Foundry Research Group. Instituto de Ciencia de Materiales de Madrid (ICMM-CSIC), Madrid E-28049, Spain.
The integration of high-dielectric-constant (high-κ) materials with two-dimensional (2D) semiconductors is promising to overcome performance limitations and reach their full theoretical potential. Here, we show that naturally occurring phlogopite mica, exfoliated into ultrathin flakes, can serve as a robust high-κ dielectric layer for transition metal dichalcogenide-based 2D electronics and optoelectronics. The wide band gap (∼4.
View Article and Find Full Text PDFSmall Methods
July 2025
Engineering Science and Mechanics, Penn State University, University Park, State College, PA, 16802, USA.
2D materials, with their atomic-scale thickness and exceptional electronic properties, hold immense potential for advancing transistor technologies beyond silicon's limitations. While large-area growth techniques like metal-organic chemical vapor deposition (MOCVD) enable scalable device fabrication, achieving monolayers with high crystallinity remains challenging. Recently, gold-assisted mechanical exfoliation has emerged as a promising alternative, offering large-area monolayers isolated directly from bulk crystals.
View Article and Find Full Text PDFJ Am Chem Soc
June 2025
National Synchrotron Radiation Laboratory, State Key Laboratory of Precision and Intelligent Chemistry, School of Nuclear Science and Technology, University of Science and Technology of China, Hefei 230029, China.
Two-dimensional (2D) lateral homojunctions possess unique geometries and properties distinct from those of other heterostructures, including perfect lattice matching and clean carrier diffusion channels, showing great potential in beyond-silicon nanoelectronics. However, the direct growth of 2D lateral homojunctions within the same crystal phase and layer remains challenging due to the limited choice of elements. Here, we report the epitaxy growth of semiconducting monolayer WS lateral homojunctions by domain engineering during chemical vapor deposition (CVD).
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