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Article Abstract

Leaf (brown) rust (LR) and stripe (yellow) rust (YR), caused by and f. sp. , respectively, significantly reduce wheat production worldwide. Disease-resistant wheat varieties offer farmers one of the most effective ways to manage these diseases. The common wheat ( L.) Arableu#1, developed by the International Maize and Wheat Improvement Center and released as Deka in Ethiopia, shows susceptibility to both LR and YR at the seedling stage but a high level of adult plant resistance (APR) to the diseases in the field. We used 142 F recombinant inbred lines (RILs) derived from Apav#1 × Arableu#1 to identify quantitative trait loci (QTLs) for APR to LR and YR. A total of 4,298 genotyping-by-sequencing markers were used to construct a genetic linkage map. The study identified four LR resistance QTLs and six YR resistance QTLs in the population. Among these, was located in the same location as , a known pleiotropic resistance gene. and were also located on wheat chromosome 1BL at 37 cM from and may represent a new segment for pleiotropic resistance to both rusts. is likely given its association with the tightly linked molecular marker . In addition, , , , , and are probably new resistance loci based on comparisons with published QTLs for resistance to LR and YR. Our results showed the diversity of minor resistance QTLs in Arableu#1 and their role in conferring near-immune levels of APR to both LR and YR, when combined with the pleiotropic APR gene /.

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http://dx.doi.org/10.1094/PDIS-10-19-2198-REDOI Listing

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