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Article Abstract
A method to determine the strain tensor and local lattice rotation with dark-field X-ray microscopy is presented. Using a set of at least three non-coplanar symmetry-equivalent Bragg reflections, the illuminated volume of the sample can be kept constant for all reflections, facilitating easy registration of the measured lattice variations. This requires an oblique diffraction geometry, the diffraction plane is neither horizontal nor vertical. We derive a closed analytical expression that allows determination of the strain and lattice rotation from the deviation of experimental observables ( goniometer angles) from their nominal values for an unstrained lattice.
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| http://www.ncbi.nlm.nih.gov/pmc/articles/PMC12321021 | PMC |
| http://dx.doi.org/10.1107/S1600576725005862 | DOI Listing |
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