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Flash memory has become a foundational technology in modern electronic systems due to its non-volatility and high density. Traditional flash architectures, including NOR and NAND, rely on two primary memory cell structures, floating-gate and charge-trap transistors, which face increasing challenges in performance. Recently, 2D materials have emerged as promising candidates to overcome the limitations of conventional flash memory. Owing to their atomically thin nature, superior electrical properties, and excellent electrostatic control, 2D materials offer significant advantages in both floating-gate and charge-trap flash cells, enabling improvements in program/erase speed, data retention, and endurance. This review provides a comprehensive overview of the integration of 2D materials into flash memory technologies, focusing on their role in enhancing performance and enabling large-scale integration. Furthermore, the unique optoelectronic properties of 2D materials introduce exciting opportunities for multifunctional flash memory applications, such as neuromorphic computing. Despite remarkable progress, challenges such as material uniformity, CMOS compatibility and EDA platform adaptation remain. This review concludes by discussing current limitations and proposing future research directions toward realizing high-performance, scalable, and multifunctional 2D material-based flash memory.
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http://dx.doi.org/10.1039/d5mh00803d | DOI Listing |
Womens Health Rep (New Rochelle)
September 2025
The Davis School of Gerontology, University of Southern California, Los Angeles, California, USA.
Objective: To explore symptoms, knowledge levels, perceptions, and use related to menopause and hormone therapy (HT) and to examine the factors associated with HT use and HT perceptions in perimenopausal and postmenopausal women.
Materials And Methods: We used a sample of 98 perimenopausal and postmenopausal women who aged 50-79 and participated in the Sex, ApoE-4, γ-aminobutyric acid, and Episodic memory (SAGE) study ( = 64.24, = 7.
Med Image Comput Comput Assist Interv
October 2024
Johns Hopkins University, Baltimore, MD 21218, USA.
Segment anything models (SAMs) are gaining attention for their zero-shot generalization capability in segmenting objects of unseen classes and in unseen domains when properly prompted. Interactivity is a key strength of SAMs, allowing users to iteratively provide prompts that specify objects of interest to refine outputs. However, to realize the interactive use of SAMs for 3D medical imaging tasks, rapid inference times are necessary.
View Article and Find Full Text PDFCurr Opin Psychol
August 2025
Universidad Autónoma Metropolitana-Iztapalapa, Av. Ferrocarril San Rafael Atlixco, Núm. 186, Col. Leyes de Reforma, C.P., 09310, Ciudad de, Mexico. Electronic address:
This paper presents a state-of-the-art review of collective memories of urban spaces, examining them from the perspective of mental maps. It is observed that urban memory reflects the socio-cultural diversity and inherent social inequalities of contemporary metropolises. Memory and cultural heritage play a significant role in urban dynamics.
View Article and Find Full Text PDFNanomaterials (Basel)
August 2025
Department of Electronic Engineering, Hanyang University, Seoul 04763, Republic of Korea.
To satisfy the superior surface quality requirements in the fabrication of HBM (High-Bandwidth Memory) and 3D NAND Flash Memory, high-efficiency Si chemical mechanical planarization (CMP) is essential. In this study, a colloidal silica abrasive-based Si-wafer CMP slurry was developed to simultaneously achieve a high polishing rate (≥10 nm/min) and low surface roughness (≤0.2 nm) without inducing CMP-induced scratches.
View Article and Find Full Text PDFAdv Sci (Weinh)
August 2025
Department of Electrical engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, 34141, South Korea.
Multilevel storage and low-voltage operation position ferroelectric transistors as promising candidates for next-generation nonvolatile memory. Among them, gate-injection-type ferroelectric transistors offer improved vertical scalability and power efficiency for three-dimensional (3D) NAND flash. However, their intricate interplay between polarization switching and charge trapping complicates systematic understanding of degradation mechanisms, limiting strategies to improve reliability and stability.
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