Category Ranking

98%

Total Visits

921

Avg Visit Duration

2 minutes

Citations

20

Article Abstract

Flash memory has become a foundational technology in modern electronic systems due to its non-volatility and high density. Traditional flash architectures, including NOR and NAND, rely on two primary memory cell structures, floating-gate and charge-trap transistors, which face increasing challenges in performance. Recently, 2D materials have emerged as promising candidates to overcome the limitations of conventional flash memory. Owing to their atomically thin nature, superior electrical properties, and excellent electrostatic control, 2D materials offer significant advantages in both floating-gate and charge-trap flash cells, enabling improvements in program/erase speed, data retention, and endurance. This review provides a comprehensive overview of the integration of 2D materials into flash memory technologies, focusing on their role in enhancing performance and enabling large-scale integration. Furthermore, the unique optoelectronic properties of 2D materials introduce exciting opportunities for multifunctional flash memory applications, such as neuromorphic computing. Despite remarkable progress, challenges such as material uniformity, CMOS compatibility and EDA platform adaptation remain. This review concludes by discussing current limitations and proposing future research directions toward realizing high-performance, scalable, and multifunctional 2D material-based flash memory.

Download full-text PDF

Source
http://dx.doi.org/10.1039/d5mh00803dDOI Listing

Publication Analysis

Top Keywords

flash memory
24
floating-gate charge-trap
8
memory
7
flash
7
materials-based flash
4
memory device
4
device mechanism
4
mechanism structure
4
structure application
4
application flash
4

Similar Publications

Objective: To explore symptoms, knowledge levels, perceptions, and use related to menopause and hormone therapy (HT) and to examine the factors associated with HT use and HT perceptions in perimenopausal and postmenopausal women.

Materials And Methods: We used a sample of 98 perimenopausal and postmenopausal women who aged 50-79 and participated in the Sex, ApoE-4, γ-aminobutyric acid, and Episodic memory (SAGE) study ( = 64.24, = 7.

View Article and Find Full Text PDF

Segment anything models (SAMs) are gaining attention for their zero-shot generalization capability in segmenting objects of unseen classes and in unseen domains when properly prompted. Interactivity is a key strength of SAMs, allowing users to iteratively provide prompts that specify objects of interest to refine outputs. However, to realize the interactive use of SAMs for 3D medical imaging tasks, rapid inference times are necessary.

View Article and Find Full Text PDF

Collective memories of urban spaces through mental maps.

Curr Opin Psychol

August 2025

Universidad Autónoma Metropolitana-Iztapalapa, Av. Ferrocarril San Rafael Atlixco, Núm. 186, Col. Leyes de Reforma, C.P., 09310, Ciudad de, Mexico. Electronic address:

This paper presents a state-of-the-art review of collective memories of urban spaces, examining them from the perspective of mental maps. It is observed that urban memory reflects the socio-cultural diversity and inherent social inequalities of contemporary metropolises. Memory and cultural heritage play a significant role in urban dynamics.

View Article and Find Full Text PDF

To satisfy the superior surface quality requirements in the fabrication of HBM (High-Bandwidth Memory) and 3D NAND Flash Memory, high-efficiency Si chemical mechanical planarization (CMP) is essential. In this study, a colloidal silica abrasive-based Si-wafer CMP slurry was developed to simultaneously achieve a high polishing rate (≥10 nm/min) and low surface roughness (≤0.2 nm) without inducing CMP-induced scratches.

View Article and Find Full Text PDF

Multilevel storage and low-voltage operation position ferroelectric transistors as promising candidates for next-generation nonvolatile memory. Among them, gate-injection-type ferroelectric transistors offer improved vertical scalability and power efficiency for three-dimensional (3D) NAND flash. However, their intricate interplay between polarization switching and charge trapping complicates systematic understanding of degradation mechanisms, limiting strategies to improve reliability and stability.

View Article and Find Full Text PDF