Impact of Annealing Treatment on the Microstructure and Micromechanical Properties of Pb-Containing and Pb-Free Solder Alloys.

Materials (Basel)

Science and Technology on Reliability and Environmental Engineering Laboratory, Beijing Institute of Structure and Environment Engineering, No 1 South Dahongmen Road, Beijing 100076, China.

Published: June 2025


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Article Abstract

This study investigates the microstructural changes and micromechanical responses of Pb-containing and Pb-free solder alloys subjected to various annealing conditions, with the goal of elucidating the relationship between microstructure evolution and micromechanical properties. Results indicate that grain size in SAC0307 and SAC305 significantly increases with annealing temperature, while that of Sn63Pb37 remains relatively stable. In Sn63Pb37, the Pb-rich phase coarsens and its area fraction increases with higher annealing temperatures, whereas in SAC0307, the intermetallic compounds (IMCs) phase coarsens but its area fraction decreases. Nano-indentation tests show that the hardness of Sn63Pb37 significantly increases with rising annealing temperature, whereas the hardness of SAC0307 decreases, and that of SAC305 remains relatively unchanged. These variations in these alloys induced by annealing are closely related to the changes in the hardness of individual phases within the grains. For Sn63Pb37, higher annealing temperatures increase the hardness of both the Sn matrix and Pb-rich phases, enhancing overall hardness. Conversely, in SAC0307, increased temperatures reduced the hardness of both the Sn matrix and IMCs phases, resulting in lower overall hardness. The differing trends in mechanical property of individual phases in three alloy are attributed to their distinct evolutions under annealing treatment. This study provides insights into the micromechanical behavior of solder alloys under annealing and offers guidance for optimizing their performance.

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http://www.ncbi.nlm.nih.gov/pmc/articles/PMC12156396PMC
http://dx.doi.org/10.3390/ma18112596DOI Listing

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