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High Dielectric Tunability and Figure of Merit at Low Voltage in (001)-Oriented Epitaxial Tetragonal PbZrTiO Thin Films. | LitMetric

High Dielectric Tunability and Figure of Merit at Low Voltage in (001)-Oriented Epitaxial Tetragonal PbZrTiO Thin Films.

Nanomaterials (Basel)

Institute of Advanced Energy Materials and Chemistry, School of Chemistry and Chemical Engineering, Qilu University of Technology (Shandong Academy of Sciences), Jinan 250353, China.

Published: May 2025


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Article Abstract

Ferroelectric thin films with a high dielectric tunability () have great potential in electrically tunable applications, including microwave tunable devices such as phase shifters, filters, delay lines, etc. Using a modified Landau-Devonshire type thermodynamic potential, we show that the dielectric tunability of a (001) tetragonal ferroelectric film can be analytically solved. After a survey of materials, a large value above 60% was predicted to be achievable in a (001)-oriented tetragonal Pb(ZrTi)O (PZT) film. Experimentally, (001)-oriented PZT thin films were prepared on LaNiO-coated (100) SrTiO substrates by using pulsed laser deposition (PLD). These films exhibited good dielectric tunability ( ~ 67.6%) measured at a small electric field of ~250 kV/cm (corresponding to 5 volts for a 200 nm thick film). It only dropped down to ~54.2% when was further reduced to 125 kV/cm (2.5 volts for 200 nm film). The measured dielectric tunability as functions of the applied electric field and measuring frequency are discussed for a 500 nm thick PZT film, with the former well described by the theoretical () curves and the latter showing a weak frequency dependence. These observations validate our integrated approach rooted in a theoretical understanding.

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Source
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC12073659PMC
http://dx.doi.org/10.3390/nano15090695DOI Listing

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