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Nanoscale hyperspectral techniques-such as electron energy loss spectroscopy (EELS)-are critical to understand the optical response in plasmonic nanostructures, but as systems become increasingly complex, the required sampling density and acquisition times become prohibitive for instrumental and specimen stability. As a result, there has been a recent push for new experimental methodologies that can provide comprehensive information about a complex system, while significantly reducing the duration of the experiment. Here, we present a pan-sharpening approach to hyperspectral EELS analysis, where we acquire two datasets from the same region (one with high spatial resolution and one with high spectral fidelity) and combine them to achieve a single dataset with the beneficial properties of both. This work outlines a straightforward, reproducible pathway to reduced experiment times and higher signal-to-noise ratios, while retaining the relevant physical parameters of the plasmonic response, and is generally applicable to a wide range of spectroscopy modalities.
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http://dx.doi.org/10.1063/5.0031324 | DOI Listing |
Sci Rep
August 2024
Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, MD, USA.
In situ Electron Energy Loss Spectroscopy (EELS) combined with Transmission Electron Microscopy (TEM) has traditionally been pivotal for understanding how material processing choices affect local structure and composition. However, the ability to monitor and respond to ultrafast transient changes, now achievable with EELS and TEM, necessitates innovative analytical frameworks. Here, we introduce a machine learning (ML) framework tailored for the real-time assessment and characterization of in operando EELS Spectrum Images (EELS-SI).
View Article and Find Full Text PDFUltramicroscopy
September 2022
Laboratoire des Physique des Solides, Université Paris Saclay, CNRS UMR 8502, Orsay, France. Electronic address:
The acquisition of a hyperspectral image is nowadays a standard technique used in the scanning transmission electron microscope. It relates the spatial position of the electron probe to the spectral data associated with it. In the case of electron energy loss spectroscopy (EELS), frame-based hyperspectral acquisition is much slower than the achievable rastering time of the scan unit (SU), which sometimes leads to undesirable effects in the sample, such as electron irradiation damage, that goes unperceived during frame acquisition.
View Article and Find Full Text PDFSci Rep
September 2021
Department of Materials Science & Engineering, Johns Hopkins University, Baltimore, MD, 21218, USA.
Recent advances in detectors for imaging and spectroscopy have afforded in situ, rapid acquisition of hyperspectral data. While electron energy loss spectroscopy (EELS) data acquisition speeds with electron counting are regularly reaching 400 frames per second with near-zero read noise, signal to noise ratio (SNR) remains a challenge owing to fundamental counting statistics. In order to advance understanding of transient materials phenomena during rapid acquisition EELS, trustworthy analysis of noisy spectra must be demonstrated.
View Article and Find Full Text PDFUltramicroscopy
December 2021
Department of Materials Science & Engineering and Research Institute of Advanced Materials (RIAM), Seoul National University, 08826, Seoul, South Korea. Electronic address:
J Chem Phys
January 2021
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA.
Nanoscale hyperspectral techniques-such as electron energy loss spectroscopy (EELS)-are critical to understand the optical response in plasmonic nanostructures, but as systems become increasingly complex, the required sampling density and acquisition times become prohibitive for instrumental and specimen stability. As a result, there has been a recent push for new experimental methodologies that can provide comprehensive information about a complex system, while significantly reducing the duration of the experiment. Here, we present a pan-sharpening approach to hyperspectral EELS analysis, where we acquire two datasets from the same region (one with high spatial resolution and one with high spectral fidelity) and combine them to achieve a single dataset with the beneficial properties of both.
View Article and Find Full Text PDF