3D/4D imaging of complex and deformed microstructures with pink-beam dark field X-ray microscopy.

Dark Field X-ray Microscopy (DFXM) has advanced 3D non-destructive, high-resolution imaging of strain and orientation in crystalline materials, enabling the study of embedded structures in bulk. However, the photon-hungry nature of monochromatic DFXM limits its applicability for studying highly deformed or weakly crystalline structures, and constrains time-resolved studies in industrially relevant materials. Here, we present pink-beam DFXM (pDFXM) at the ID03 beamline of ESRF, achieving a 27-fold increase in diffracted intensity while maintaining 100 nm spatial resolution.