Development of Yellow Rust-Resistant and High-Yielding Bread Wheat ( L.) Lines Using Marker-Assisted Backcrossing Strategies.

The fungal pathogen f. sp. , which causes yellow rust disease, poses a significant economic threat to wheat production not only in Uzbekistan but also globally, leading to substantial reductions in grain yield.

Development and Characterization of Synthetic Allotetraploids Between Diploid Species and for Cotton Genetic Improvement.

Expanding genetic variability of cultivated cotton () is essential for improving fiber quality and pest resistance. This study synthesized allotetraploids through interspecific hybridization between (A) and (G). Upon chromosome doubling using 0.