Publications by authors named "Konrad Perzynski"

We summarize a data analysis approach for electron backscatter diffraction (EBSD) which uses high-resolution Kikuchi pattern simulations to measure isochoric relative deformation gradient tensors from experimentally measured Kikuchi patterns of relatively low resolution. Simulation-based supersampling of the theoretical test diffraction patterns enables a significant precision improvement of tensor parameters obtained in best-fit determinations of strains and orientations from low-resolution experimental patterns. As an application, we demonstrate high-resolution orientation and strain analysis for the model case of hardness test indents on a Si(100) wafer, using Kikuchi patterns of variable resolution.

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This article presents the results of research concerning a comprehensive analysis of the operation of tools used for forming ceramic roof tiles in the clay-based band extrusion process. The conducted studies demonstrated that key process parameters, such as extrusion pressure and the flow speed of the ceramic mass containing hard components, are crucial for the durability of the tools, significantly affecting their wear. The analysis of the formed mass revealed the presence of hard fractions, such as quartz, zircon, and garnet, which significantly contribute to tool abrasion.

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Dynamic recrystallisation (DRX) is one of the fundamental phenomena in materials science, significantly impacting the microstructure and mechanical properties of components subjected to large plastic deformations. Experimental research on that topic carried out for a wide range of new metallic materials is often supported by computational materials science. A direct consideration and detailed understanding of this phenomenon are possible with a class of full-field numerical models based on the cellular automata (CA) method.

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Numerical study of the influence of pulsed laser deposited TiN thin films' microstructure morphologies on strain heterogeneities during loading was the goal of this research. The investigation was based on the digital material representation (DMR) concept applied to replicate an investigated thin film's microstructure morphology. The physically based pulsed laser deposited model was implemented to recreate characteristic features of a thin film microstructure.

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