How pigment distribution influences the cuticle density within a microscopic butterfly wing scale, and how both impact each scale's final reflected color, remains unknown. We use ptychographic X-ray computed tomography to quantitatively determine, at nanoscale resolutions, the three-dimensional mass density of scales with pigmentation differences. By comparing cuticle densities between two pairs of scales with pigmentation differences, we determine that the density of the lower lamina is inversely correlated with pigmentation.
View Article and Find Full Text PDFA new nanoporous amorphous carbon (NAC) structure that achieves both ultrahigh strength and high electrical conductivity, which are usually incompatible in porous materials is reported. By using modified spark plasma sintering, three amorphous carbon phases with different atomic bonding configurations are created. The composite consisted of an amorphous sp-carbon matrix mixed with amorphous sp-carbon and amorphous graphitic motif.
View Article and Find Full Text PDFUltramicroscopy
August 2024
Ewald sphere curvature correction, which extends beyond the projection approximation, stretches the shallow depth of field in cryo-EM reconstructions of thick particles. Here we show that even for previously assumed thin particles, reconstruction artifacts which we refer to as ghosts can appear. By retrieving the lost phases of the electron exitwaves and accounting for the first Born approximation scattering within the particle, we show that these ghosts can be effectively eliminated.
View Article and Find Full Text PDFACS Appl Mater Interfaces
February 2022
Robust processes to fabricate densely packed high-aspect-ratio (HAR) vertical semiconductor nanostructures are important for applications in microelectronics, energy storage and conversion. One of the main challenges in manufacturing these nanostructures is pattern collapse, which is the damage induced by capillary forces from numerous solution-based processes used during their fabrication. Here, using an array of vertical silicon (Si) nanopillars as test structures, we demonstrate that pattern collapse can be greatly reduced by a solution-phase deposition method to coat the nanopillars with self-assembled monolayers (SAMs).
View Article and Find Full Text PDFFast, direct electron detectors have significantly improved the spatio-temporal resolution of electron microscopy movies. Preserving both spatial and temporal resolution in extended observations, however, requires storing prohibitively large amounts of data. Here, we describe an efficient and flexible data reduction and compression scheme (ReCoDe) that retains both spatial and temporal resolution by preserving individual electron events.
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